%0 Conference Paper %1 conf/dtis/WillschHHDKV18 %A Willsch, Benjamin %A te Heesen, Marius %A Hauser, Julia %A Dreiner, Stefan %A Kappert, Holger %A Vogt, Holger %B DTIS %D 2018 %I IEEE %K dblp %P 1-6 %T Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology. %U http://dblp.uni-trier.de/db/conf/dtis/dtis2018.html#WillschHHDKV18 %@ 978-1-5386-5291-6

@inproceedings{conf/dtis/WillschHHDKV18, added-at = {2020-09-05T00:00:00.000+0200}, author = {Willsch, Benjamin and te Heesen, Marius and Hauser, Julia and Dreiner, Stefan and Kappert, Holger and Vogt, Holger}, biburl = {https://www.bibsonomy.org/bibtex/289d83ca50d2281097177a316b1f0da96/dblp}, booktitle = {DTIS}, crossref = {conf/dtis/2018}, ee = {https://doi.org/10.1109/DTIS.2018.8368576}, interhash = {a66fc9cf084a12fa21ce5352f5dd19dc}, intrahash = {89d83ca50d2281097177a316b1f0da96}, isbn = {978-1-5386-5291-6}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2020-09-09T14:24:32.000+0200}, title = {Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology.}, url = {http://dblp.uni-trier.de/db/conf/dtis/dtis2018.html#WillschHHDKV18}, year = 2018 }