%0 Report %1 WHIT2008 %A White, Mark %A Bernstein, Joseph B. %C Pasadena, CA %D 2008 %K imported %T Microelectronics reliability : physics-of-failure based modeling and lifetime evaluation %U http://hdl.handle.net/2014/40791

@techreport{WHIT2008, added-at = {2013-01-07T16:10:56.000+0100}, address = {Pasadena, CA}, author = {White, Mark and Bernstein, Joseph B.}, biburl = {https://www.bibsonomy.org/bibtex/2914dc3b72a567f040eea80c0352cc2ae/olivia.bluder}, file = {:P\:\\KAI_AP2\\People\\Plankensteiner\\DISS\\Literature_lifetimeModels\\WHITE2008.pdf:PDF}, institution = {Jet Propulsion Laboratory, National Aeronautics and Space Administration}, interhash = {99c096de596ed5dc0a8192a56dac2c47}, intrahash = {914dc3b72a567f040eea80c0352cc2ae}, keywords = {imported}, owner = {bluder}, timestamp = {2013-01-07T16:11:02.000+0100}, title = {Microelectronics reliability : physics-of-failure based modeling and lifetime evaluation}, url = {http://hdl.handle.net/2014/40791}, year = 2008 }