%0 Journal Article %1 journals/tie/AvinoSalvadoBBRBRMP24 %A Avino-Salvado, Oriol %A Buttay, Cyril %A Bonet, Ferran %A Raynaud, Christophe %A Bevilacqua, Pascal %A Rebollo, José %A Morel, Hervé %A Perpiñà, Xavier %D 2024 %J IEEE Trans. Ind. Electron. %K dblp %N 5 %P 5285-5295 %T Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. %U http://dblp.uni-trier.de/db/journals/tie/tie71.html#AvinoSalvadoBBRBRMP24 %V 71

@article{journals/tie/AvinoSalvadoBBRBRMP24, added-at = {2024-01-24T00:00:00.000+0100}, author = {Avino-Salvado, Oriol and Buttay, Cyril and Bonet, Ferran and Raynaud, Christophe and Bevilacqua, Pascal and Rebollo, José and Morel, Hervé and Perpiñà, Xavier}, biburl = {https://www.bibsonomy.org/bibtex/29396023e823fb4462f7540d98ffd119f/dblp}, ee = {https://doi.org/10.1109/TIE.2023.3281705}, interhash = {33a75052753d1b305b533e106f506271}, intrahash = {9396023e823fb4462f7540d98ffd119f}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, month = May, number = 5, pages = {5285-5295}, timestamp = {2024-04-08T10:31:47.000+0200}, title = {Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie71.html#AvinoSalvadoBBRBRMP24}, volume = 71, year = 2024 }