%0 Conference Paper %1 conf/iccad/HoLYKLJL13 %A Ho, Shin-Yann %A Lin, Shuo-Ren %A Yuan, Ko-Lung %A Kuo, Chien-Yen %A Liao, Kuan-Yu %A Jiang, Jie-Hong R. %A Li, Chien-Mo James %B ICCAD %D 2013 %E Henkel, Jörg %I IEEE %K dblp %P 91-98 %T Automatic test pattern generation for delay defects using timed characteristic functions. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#HoLYKLJL13 %@ 978-1-4799-1069-4

@inproceedings{conf/iccad/HoLYKLJL13, added-at = {2017-05-24T00:00:00.000+0200}, author = {Ho, Shin-Yann and Lin, Shuo-Ren and Yuan, Ko-Lung and Kuo, Chien-Yen and Liao, Kuan-Yu and Jiang, Jie-Hong R. and Li, Chien-Mo James}, biburl = {https://www.bibsonomy.org/bibtex/2a30ababcf2ffb6d61593b5add582f6cb/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2013}, editor = {Henkel, Jörg}, ee = {http://dl.acm.org/citation.cfm?id=2561848}, interhash = {5002df2b359740b640778f1237991503}, intrahash = {a30ababcf2ffb6d61593b5add582f6cb}, isbn = {978-1-4799-1069-4}, keywords = {dblp}, pages = {91-98}, publisher = {IEEE}, timestamp = {2019-10-17T22:45:18.000+0200}, title = {Automatic test pattern generation for delay defects using timed characteristic functions.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#HoLYKLJL13}, year = 2013 }