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Disambiguation of "Li, Chien-Mo James"

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Automatic test pattern generation for delay defects using timed characteristic functions.

, , , , , , and . ICCAD, page 91-98. IEEE, (2013)

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Chen-Chien Li

Chien-Kang Li

Michael James

Audrein James

Chieh Chien

 

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Effective and Economic Phase Noise Testing for Single-Chip TV Tuners., , , , and . IEEE Trans. Instrumentation and Measurement, 57 (10): 2265-2272 (2008)Structural Reduction Techniques for Logic-Chain Bridging Fault Diagnosis., , and . IEEE Trans. Computers, 61 (7): 928-938 (2012)Test methodology for PCHB/PCFB Asynchronous Circuits., , , , and . ITC, page 1-8. IEEE, (2018)Test Pattern Modification for Average IR-Drop Reduction., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 38-49 (2016)DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 18 (3): 392-400 (2010)Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (9): 1980-1989 (2014)Diagnosis of single stuck-at faults and multiple timing faults in scan chains.. IEEE Trans. Very Large Scale Integr. Syst., 13 (6): 708-718 (2005)Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns.. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 88-A (4): 1024-1030 (2005)Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips., , , , , and . IET Comput. Digit. Tech., 5 (4): 238-246 (2011)Fault modeling and testing of retention flip-flops in low power designs., , , and . ASP-DAC, page 684-689. IEEE, (2009)