%0 Conference Paper %1 KuoTimingAnalyzer %A Kuo, M.M.Y. %A Yoong, Li Hsien %A Andalam, S. %A Roop, P.S. %B Industrial Informatics (INDIN), 2010 8th IEEE International Conference on %D 2010 %K 61499 IEC blocks;embedded computers;feedback computing;feedback;formal control; engineering function loop;industrial process-control reaction standards;control systems;model-checking technique;worst-case time;IEC timing verification;process %P 1104 -1109 %R 10.1109/INDIN.2010.5549585 %T Determining the worst-case reaction time of IEC 61499 function blocks

@inproceedings{KuoTimingAnalyzer, added-at = {2014-10-29T10:45:52.000+0100}, author = {Kuo, M.M.Y. and Yoong, Li Hsien and Andalam, S. and Roop, P.S.}, biburl = {https://www.bibsonomy.org/bibtex/2ab3bce7df57b834be4623f98a5d86be8/zeeshanejaz}, booktitle = {Industrial Informatics (INDIN), 2010 8th IEEE International Conference on}, doi = {10.1109/INDIN.2010.5549585}, interhash = {c22fbd5ab414524bbcf1b4c5d0810242}, intrahash = {ab3bce7df57b834be4623f98a5d86be8}, keywords = {61499 IEC blocks;embedded computers;feedback computing;feedback;formal control; engineering function loop;industrial process-control reaction standards;control systems;model-checking technique;worst-case time;IEC timing verification;process}, month = {July}, pages = {1104 -1109}, timestamp = {2014-10-29T10:48:22.000+0100}, title = {{D}etermining the worst-case reaction time of {IEC} 61499 function blocks}, year = 2010 }