%0 Conference Paper %1 conf/itc/SunterMD01 %A Sunter, Stephen K. %A McDonald, Charles %A Danialy, Givargis %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 204-210 %T Contactless digital testing of IC pin leakage currents. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#SunterMD01 %@ 0-7803-7169-0

@inproceedings{conf/itc/SunterMD01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Sunter, Stephen K. and McDonald, Charles and Danialy, Givargis}, biburl = {https://www.bibsonomy.org/bibtex/2c933dcd6918fe3bf8b076db9c12215aa/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966635}, interhash = {d0b5162d1b9ad7fd033a1c04124237d2}, intrahash = {c933dcd6918fe3bf8b076db9c12215aa}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {204-210}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {Contactless digital testing of IC pin leakage currents.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#SunterMD01}, year = 2001 }