%0 Conference Paper %1 conf/vts/YuanLW91 %A Yuan, Jiann-Shiun %A Liou, Juin J. %A Wu, David M. %B VTS %D 1991 %I IEEE Computer Society %K dblp %P 233-238 %T Testing the impact of process defects on ECL power-delay performance. %U http://dblp.uni-trier.de/db/conf/vts/vts1991.html#YuanLW91

@inproceedings{conf/vts/YuanLW91, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yuan, Jiann-Shiun and Liou, Juin J. and Wu, David M.}, biburl = {https://www.bibsonomy.org/bibtex/2d7286035daf577d4096820d683868f06/dblp}, booktitle = {VTS}, crossref = {conf/vts/1991}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1991.208164}, interhash = {922a18808dd5d8585c63370c1bb0ffb0}, intrahash = {d7286035daf577d4096820d683868f06}, keywords = {dblp}, pages = {233-238}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:10.000+0200}, title = {Testing the impact of process defects on ECL power-delay performance.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1991.html#YuanLW91}, year = 1991 }