%0 Conference Paper %1 conf/irps/ContaminCGGVGJV22 %A Contamin, Lauriane %A Cassé, Mikaël %A Garros, Xavier %A Gaillard, Fred %A Vinet, Maud %A Galy, Philippe %A Juge, André %A Vincent, Emmanuel %A Franceschi, Silvano De %A Meunier, Tristan %B IRPS %D 2022 %I IEEE %K dblp %P 7 %T Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ContaminCGGVGJV22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/ContaminCGGVGJV22, added-at = {2022-05-10T00:00:00.000+0200}, author = {Contamin, Lauriane and Cassé, Mikaël and Garros, Xavier and Gaillard, Fred and Vinet, Maud and Galy, Philippe and Juge, André and Vincent, Emmanuel and Franceschi, Silvano De and Meunier, Tristan}, biburl = {https://www.bibsonomy.org/bibtex/2e2e1f4f3dfff2b859dcfe4f1efcde9f0/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764571}, interhash = {a37bd423ff0057585f8a4999418655e8}, intrahash = {e2e1f4f3dfff2b859dcfe4f1efcde9f0}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = 7, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ContaminCGGVGJV22}, year = 2022 }