%0 Conference Paper %1 conf/ats/BaikS05 %A Baik, Dong Hyun %A Saluja, Kewal K. %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 272-277 %T State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#BaikS05 %@ 0-7695-2481-8

@inproceedings{conf/ats/BaikS05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Baik, Dong Hyun and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/2ed2c31a71ba1ba5458a4760b0a191902/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.101}, interhash = {aad6786fd9573cb3f58faae6f08aeb8e}, intrahash = {ed2c31a71ba1ba5458a4760b0a191902}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {272-277}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#BaikS05}, year = 2005 }