%0 Journal Article %1 journals/mr/WangCNZZSKZ16 %A Wang, You %A Cai, Hao %A Naviner, Lirida A. B. %A Zhao, Xiaoxuan %A Zhang, Yue %A Slimani, Mariem %A Klein, Jacques-Olivier %A Zhao, Weisheng %D 2016 %J Microelectron. Reliab. %K dblp %P 26-30 %T A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#WangCNZZSKZ16 %V 64

@article{journals/mr/WangCNZZSKZ16, added-at = {2024-05-07T00:00:00.000+0200}, author = {Wang, You and Cai, Hao and Naviner, Lirida A. B. and Zhao, Xiaoxuan and Zhang, Yue and Slimani, Mariem and Klein, Jacques-Olivier and Zhao, Weisheng}, biburl = {https://www.bibsonomy.org/bibtex/2fd923dadc3b58e765c3711d3d8a98ac9/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.073}, interhash = {038e414ec1f4c1ddcfd53bf582fb4330}, intrahash = {fd923dadc3b58e765c3711d3d8a98ac9}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {26-30}, timestamp = {2024-05-13T07:47:56.000+0200}, title = {A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#WangCNZZSKZ16}, volume = 64, year = 2016 }