%0 Conference Paper %1 conf/irps/YanDQZZ22 %A Yan, Chu %A Ding, Yaru %A Qu, Yiming %A Zhao, Liang %A Zhao, Yi %B IRPS %D 2022 %I IEEE %K dblp %P 7 %T Universal Hot Carrier Degradation Model under DC and AC Stresses. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#YanDQZZ22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/YanDQZZ22, added-at = {2022-10-02T00:00:00.000+0200}, author = {Yan, Chu and Ding, Yaru and Qu, Yiming and Zhao, Liang and Zhao, Yi}, biburl = {https://www.bibsonomy.org/bibtex/2f03a59b610a928ec158442fe6489e961/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764580}, interhash = {33cd602520df6bff72c274dc05fff945}, intrahash = {f03a59b610a928ec158442fe6489e961}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = 7, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Universal Hot Carrier Degradation Model under DC and AC Stresses.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#YanDQZZ22}, year = 2022 }