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Universal Hot Carrier Degradation Model under DC and AC Stresses.

C. Yan, Y. Ding, Y. Qu, L. Zhao, and Y. Zhao. IRPS, page 7. IEEE, (2022)

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Yiming Chen

Yiming Ma

Yiming Deng

Yiming Zhang

Yiming Wu

Other publications of authors with the same name

Sub-1 ns characterization methodology for transistor electrical parameter extraction.Y. Qu, B. Chen, W. Liu, J. Han, J. Lu, and Y. Zhao. Microelectron. Reliab., (2018)Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.Y. Qu, R. Cheng, W. Liu, J. Li, B. Nguyen, O. Faynot, N. Xu, B. Chen, and Y. Zhao. IRPS, page 6. IEEE, (2018)GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model.X. Yu, C. Yan, Y. Ding, Y. Qu, and Y. Zhao. IRPS, page 1-6. IEEE, (2023)Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System.S. Gao, B. Chen, N. Xu, Y. Qu, and Y. Zhao. IRPS, page 1-4. IEEE, (2019)Interval time dependent wake-up effect of HfZrO ferroelectric capacitor.Y. Ding, X. Yu, C. Yan, Z. Weng, Y. Qu, and Y. Zhao. IRPS, page 1-4. IEEE, (2023)Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.Y. Ding, W. Liu, Y. Qu, L. Zhao, and Y. Zhao. IRPS, page 50-1. IEEE, (2022)In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation.Y. Qu, J. Lu, J. Li, Z. Chen, J. Zhang, C. Li, S. Lee, and Y. Zhao. IRPS, page 1-6. IEEE, (2020)GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States.Y. Qu, C. Yan, X. Yu, Y. Ding, and Y. Zhao. IRPS, page 1-6. IEEE, (2023)Nano-scaled transistor reliability characterization at nano-second regime.R. Cheng, Y. Sun, Y. Qu, W. Liu, F. Liu, J. Gao, N. Xu, and B. Chen. Sci. China Inf. Sci., (2021)Multimedia teaching resource allocation method for distance online education based on packet cluster mapping.Y. Qu, I. Chen, and S. Meng. Int. J. Inf. Commun. Technol., 23 (4): 314-326 (2023)

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Disambiguation of "Qu, Yiming"

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Universal Hot Carrier Degradation Model under DC and AC Stresses.

Please choose a person to relate this publication to

Yiming Chen

Yiming Ma

Yiming Deng

Yiming Zhang

Yiming Wu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Qu, Yiming"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Universal Hot Carrier Degradation Model under DC and AC Stresses.

Please choose a person to relate this publication to

Yiming Chen

Yiming Ma

Yiming Deng

Yiming Zhang

Yiming Wu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Universal Hot Carrier Degradation Model under DC and AC Stresses.