%0 Journal Article %1 journals/mr/Martin-MartinezGRNACPG07 %A Martín-Martínez, Javier %A Gerardin, Simone %A Rodríguez, Rosana %A Nafría, Montserrat %A Aymerich, Xavier %A Cester, Andrea %A Paccagnella, Alessandro %A Ghidini, G. %D 2007 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1349-1352 %T Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#Martin-MartinezGRNACPG07 %V 47

@article{journals/mr/Martin-MartinezGRNACPG07, added-at = {2022-10-02T00:00:00.000+0200}, author = {Martín-Martínez, Javier and Gerardin, Simone and Rodríguez, Rosana and Nafría, Montserrat and Aymerich, Xavier and Cester, Andrea and Paccagnella, Alessandro and Ghidini, G.}, biburl = {https://www.bibsonomy.org/bibtex/247005063f3c7da7e091259b3fc42976c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.088}, interhash = {3809c9e62491aa5a5f9389e7dc048af7}, intrahash = {47005063f3c7da7e091259b3fc42976c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1349-1352}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#Martin-MartinezGRNACPG07}, volume = 47, year = 2007 }