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Disambiguation of "Nafría, Montserrat"

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Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.

, , , , , , , and . Microelectron. Reliab., 47 (9-11): 1349-1352 (2007)

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Montserrat Pally

Montserrat Elizalde Vilalta

Montserrat Freixa Pascual

Montserrat Armengol Gelonch

Maria-Montserrat Bleker

 

Other publications of authors with the same name

Investigation of Conductivity Changes in Memristors under Massive Pulsed Characterization., , , , and . DCIS, page 1-4. IEEE, (2018)Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO2 films., , , and . Microelectron. Reliab., 41 (7): 1011-1013 (2001)Influence of the SiO2 layer thickness on the degradation of HfO2/SiO2 stacks subjected to static and dynamic stress conditions., , , , and . Microelectron. Reliab., 47 (4-5): 544-547 (2007)SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors., , , , , , , and . Microelectron. Reliab., 50 (9-11): 1263-1266 (2010)Pre- and post-BD electrical conduction of stressed HfO2/SiO2 MOS gate stacks observed at the nanoscale., , , and . Microelectron. Reliab., 45 (9-11): 1390-1393 (2005)Reliability simulation for analog ICs: Goals, solutions, and challenges., , , , , , , and . Integr., (2016)Effect of oxide breakdown on RS latches., , , and . Microelectron. Reliab., 47 (4-5): 581-584 (2007)Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells., , , , , , , and . SMACD, page 1-4. IEEE, (2017)Threshold voltage and on-current Variability related to interface traps spatial distribution., , , , , , , , and . ESSDERC, page 230-233. IEEE, (2015)Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits., , , , , , , and . IEEE Trans. Instrum. Meas., 69 (3): 853-864 (2020)