%0 Journal Article %1 journals/mr/TanLG12 %A Tan, Cher Ming %A Li, Wei %A Gan, Zhenghao %D 2012 %J Microelectron. Reliab. %K dblp %N 8 %P 1539-1545 %T Applications of finite element methods for reliability study of ULSI interconnections. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#TanLG12 %V 52

@article{journals/mr/TanLG12, added-at = {2020-02-22T00:00:00.000+0100}, author = {Tan, Cher Ming and Li, Wei and Gan, Zhenghao}, biburl = {https://www.bibsonomy.org/bibtex/29dd29cf584feedf96f27be6e73e056fb/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.09.015}, interhash = {38c4f76f90bebc85762b50e74217fff9}, intrahash = {9dd29cf584feedf96f27be6e73e056fb}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1539-1545}, timestamp = {2020-02-25T13:29:55.000+0100}, title = {Applications of finite element methods for reliability study of ULSI interconnections.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#TanLG12}, volume = 52, year = 2012 }