%0 Conference Paper %1 conf/ats/XuWDS97 %A Xu, Shiyi %A Waignjo, Peter %A Dias, Percy G. %A Shi, Bole %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 48- %T Testability Prediction for Sequential Circuits Using Neural Network. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#XuWDS97 %@ 0-8186-8209-4

@inproceedings{conf/ats/XuWDS97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Xu, Shiyi and Waignjo, Peter and Dias, Percy G. and Shi, Bole}, biburl = {https://www.bibsonomy.org/bibtex/2ff3f502190bae16cb30f6d2a40b77ed8/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643916}, interhash = {3ab46595cb2942bdcb7b509d9faa0257}, intrahash = {ff3f502190bae16cb30f6d2a40b77ed8}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {48-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {Testability Prediction for Sequential Circuits Using Neural Network.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#XuWDS97}, year = 1997 }