%0 Journal Article %1 journals/mr/HeerBMPHGKSR07 %A Heer, Michael %A Bychikhin, Sergey %A Mamanee, W. %A Pogany, Dionyz %A Heid, A. %A Grombach, P. %A Klaussner, M. %A Soppa, Winfried %A Ramler, Bernd %D 2007 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1450-1455 %T Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#HeerBMPHGKSR07 %V 47

@article{journals/mr/HeerBMPHGKSR07, added-at = {2023-11-10T00:00:00.000+0100}, author = {Heer, Michael and Bychikhin, Sergey and Mamanee, W. and Pogany, Dionyz and Heid, A. and Grombach, P. and Klaussner, M. and Soppa, Winfried and Ramler, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/28cde709f752d74ac686821c249642fb5/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.092}, interhash = {4576c2b7685f2408759526fe1124e6ae}, intrahash = {8cde709f752d74ac686821c249642fb5}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1450-1455}, timestamp = {2024-04-09T02:49:37.000+0200}, title = {Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#HeerBMPHGKSR07}, volume = 47, year = 2007 }