%0 Journal Article %1 journals/tvlsi/ArumiMFEHK11 %A Arumí, Daniel %A Rodríguez-Montañés, Rosa %A Figueras, Joan %A Eichenberger, Stefan %A Hora, Camelia %A Kruseman, Bram %D 2011 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 12 %P 2209-2220 %T Gate Leakage Impact on Full Open Defects in Interconnect Lines. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi19.html#ArumiMFEHK11 %V 19

@article{journals/tvlsi/ArumiMFEHK11, added-at = {2020-03-11T00:00:00.000+0100}, author = {Arumí, Daniel and Rodríguez-Montañés, Rosa and Figueras, Joan and Eichenberger, Stefan and Hora, Camelia and Kruseman, Bram}, biburl = {https://www.bibsonomy.org/bibtex/23bb45cade309b80b5fba82967a44c647/dblp}, ee = {https://doi.org/10.1109/TVLSI.2010.2077315}, interhash = {492597edc6d9895ba7cd17277a73a110}, intrahash = {3bb45cade309b80b5fba82967a44c647}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 12, pages = {2209-2220}, timestamp = {2020-03-12T11:43:50.000+0100}, title = {Gate Leakage Impact on Full Open Defects in Interconnect Lines.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi19.html#ArumiMFEHK11}, volume = 19, year = 2011 }