%0 Journal Article %1 journals/mr/WhitmanMZ17 %A Whitman, Charles S. %A Meeder, Michael G. %A Zampardi, Peter J. %D 2017 %J Microelectron. Reliab. %K dblp %P 5-12 %T Determination of safe reliability region over temperature and current density for through wafer vias. %U http://dblp.uni-trier.de/db/journals/mr/mr68.html#WhitmanMZ17 %V 68

@article{journals/mr/WhitmanMZ17, added-at = {2020-02-22T00:00:00.000+0100}, author = {Whitman, Charles S. and Meeder, Michael G. and Zampardi, Peter J.}, biburl = {https://www.bibsonomy.org/bibtex/22fe07f5bd795a224d101fcf11c893200/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.09.011}, interhash = {58ecd9f0a3719db1d84cef1b91b75717}, intrahash = {2fe07f5bd795a224d101fcf11c893200}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {5-12}, timestamp = {2020-02-25T13:28:53.000+0100}, title = {Determination of safe reliability region over temperature and current density for through wafer vias.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr68.html#WhitmanMZ17}, volume = 68, year = 2017 }