%0 Journal Article %1 journals/mr/VoldmanAACDMW01 %A Voldman, Steven H. %A Anderson, W. %A Ashton, R. %A Chaine, M. %A Duvvury, Charvaka %A Maloney, T. %A Worley, E. %D 2001 %J Microelectron. Reliab. %K dblp %N 3 %P 335-348 %T A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#VoldmanAACDMW01 %V 41

@article{journals/mr/VoldmanAACDMW01, added-at = {2020-09-14T00:00:00.000+0200}, author = {Voldman, Steven H. and Anderson, W. and Ashton, R. and Chaine, M. and Duvvury, Charvaka and Maloney, T. and Worley, E.}, biburl = {https://www.bibsonomy.org/bibtex/29d97f03cb2e726d01ea00ff2347327b1/dblp}, ee = {https://doi.org/10.1016/S0026-2714(00)00236-5}, interhash = {6447b75c8697d314ad4e64d0d172103c}, intrahash = {9d97f03cb2e726d01ea00ff2347327b1}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 3, pages = {335-348}, timestamp = {2020-09-15T11:34:55.000+0200}, title = {A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#VoldmanAACDMW01}, volume = 41, year = 2001 }