%0 Journal Article %1 journals/mj/KushwahaKAKDHC16 %A Kushwaha, Pragya %A Krishna, K. Bala %A Agarwal, Harshit %A Khandelwal, Sourabh %A Duarte, Juan Pablo %A Hu, Chenming %A Chauhan, Yogesh Singh %D 2016 %J Microelectron. J. %K dblp %P 171-176 %T Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG. %U http://dblp.uni-trier.de/db/journals/mj/mj56.html#KushwahaKAKDHC16 %V 56

@article{journals/mj/KushwahaKAKDHC16, added-at = {2022-04-09T00:00:00.000+0200}, author = {Kushwaha, Pragya and Krishna, K. Bala and Agarwal, Harshit and Khandelwal, Sourabh and Duarte, Juan Pablo and Hu, Chenming and Chauhan, Yogesh Singh}, biburl = {https://www.bibsonomy.org/bibtex/2f02d4c34931d91ef7bc4cd6468cac9b9/dblp}, ee = {https://doi.org/10.1016/j.mejo.2016.07.014}, interhash = {6b9231a852f9f7ace86de71eb97c1afc}, intrahash = {f02d4c34931d91ef7bc4cd6468cac9b9}, journal = {Microelectron. J.}, keywords = {dblp}, pages = {171-176}, timestamp = {2024-04-08T21:37:16.000+0200}, title = {Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj56.html#KushwahaKAKDHC16}, volume = 56, year = 2016 }