%0 Conference Paper %1 conf/ats/IwataYOF05 %A Iwata, Hiroyuki %A Yoneda, Tomokazu %A Ohtake, Satoshi %A Fujiwara, Hideo %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 306-311 %T A DFT Method for RTL Data Paths Based on Partially Strong Testability to Guarantee Complete Fault Efficiency. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#IwataYOF05 %@ 0-7695-2481-8

@inproceedings{conf/ats/IwataYOF05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Iwata, Hiroyuki and Yoneda, Tomokazu and Ohtake, Satoshi and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2e45301c9defcb88e5576446ccce73bac/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.8}, interhash = {6e35096b1502535c2ce38280eeb8cc00}, intrahash = {e45301c9defcb88e5576446ccce73bac}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {306-311}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {A DFT Method for RTL Data Paths Based on Partially Strong Testability to Guarantee Complete Fault Efficiency.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#IwataYOF05}, year = 2005 }