%0 Journal Article %1 journals/mr/BagatinGPCIN10 %A Bagatin, Marta %A Gerardin, Simone %A Paccagnella, Alessandro %A Cellere, Giorgio %A Irom, F. %A Nguyen, D. N. %D 2010 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1832-1836 %T Destructive events in NAND Flash memories irradiated with heavy ions. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#BagatinGPCIN10 %V 50

@article{journals/mr/BagatinGPCIN10, added-at = {2023-04-22T00:00:00.000+0200}, author = {Bagatin, Marta and Gerardin, Simone and Paccagnella, Alessandro and Cellere, Giorgio and Irom, F. and Nguyen, D. N.}, biburl = {https://www.bibsonomy.org/bibtex/2053da3c8af18194eee6dba9d539344e8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.032}, interhash = {7d863555363a53b299ab7898e35af6e2}, intrahash = {053da3c8af18194eee6dba9d539344e8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1832-1836}, timestamp = {2024-04-09T02:50:21.000+0200}, title = {Destructive events in NAND Flash memories irradiated with heavy ions.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#BagatinGPCIN10}, volume = 50, year = 2010 }