%0 Journal Article %1 journals/tvlsi/NakataHMMMM14 %A Nakata, Shunji %A Hanazono, Hiroki %A Makino, Hiroshi %A Morimura, Hiroki %A Miyama, Masayuki %A Matsuda, Yoshio %D 2014 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 3 %P 686-690 %T Increase in Read Noise Margin of Single-Bit-Line SRAM Using Adiabatic Change of Word Line Voltage. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#NakataHMMMM14 %V 22

@article{journals/tvlsi/NakataHMMMM14, added-at = {2020-03-11T00:00:00.000+0100}, author = {Nakata, Shunji and Hanazono, Hiroki and Makino, Hiroshi and Morimura, Hiroki and Miyama, Masayuki and Matsuda, Yoshio}, biburl = {https://www.bibsonomy.org/bibtex/29872f2f8d57a976340d551aa1f65e85d/dblp}, ee = {https://doi.org/10.1109/TVLSI.2013.2247642}, interhash = {7e0b21ce0b0cc6816a6ae2637a4af24d}, intrahash = {9872f2f8d57a976340d551aa1f65e85d}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 3, pages = {686-690}, timestamp = {2020-03-12T11:41:21.000+0100}, title = {Increase in Read Noise Margin of Single-Bit-Line SRAM Using Adiabatic Change of Word Line Voltage.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#NakataHMMMM14}, volume = 22, year = 2014 }