%0 Conference Paper %1 conf/irps/JiangSKPSP19 %A Jiang, Hai %A Sagong, Hyun-Chul %A Kim, Jinju %A Park, Junekyun %A Shin, Sangchul %A Pae, Sangwoo %B IRPS %D 2019 %I IEEE %K dblp %P 1-5 %T Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#JiangSKPSP19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/JiangSKPSP19, added-at = {2021-10-14T00:00:00.000+0200}, author = {Jiang, Hai and Sagong, Hyun-Chul and Kim, Jinju and Park, Junekyun and Shin, Sangchul and Pae, Sangwoo}, biburl = {https://www.bibsonomy.org/bibtex/2ac5362962224f8285c56bbe5b887971b/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720409}, interhash = {7fc6966c13e2b23da27efdc5d9d72e3f}, intrahash = {ac5362962224f8285c56bbe5b887971b}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-10T16:55:06.000+0200}, title = {Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#JiangSKPSP19}, year = 2019 }