%0 Conference Paper %1 conf/eit/WuCLR08 %A Wu, Po-Han %A Chen, Tsung-Tang %A Li, Wei-Lin %A Rau, Jiann-Chyi %B EIT %D 2008 %I IEEE %K dblp %P 237-241 %T An efficient test-data compaction for low power VLSI testing. %U http://dblp.uni-trier.de/db/conf/eit/eit2008.html#WuCLR08 %@ 978-1-4244-2030-8

@inproceedings{conf/eit/WuCLR08, added-at = {2009-11-16T00:00:00.000+0100}, author = {Wu, Po-Han and Chen, Tsung-Tang and Li, Wei-Lin and Rau, Jiann-Chyi}, biburl = {https://www.bibsonomy.org/bibtex/252c9f095e37680c795575d51bd5840a2/dblp}, booktitle = {EIT}, crossref = {conf/eit/2008}, date = {2009-11-16}, description = {dblp}, ee = {http://dx.doi.org/10.1109/EIT.2008.4554304}, interhash = {8e1b0b7b14f7290539efeee2da1c3821}, intrahash = {52c9f095e37680c795575d51bd5840a2}, isbn = {978-1-4244-2030-8}, keywords = {dblp}, pages = {237-241}, publisher = {IEEE}, timestamp = {2009-11-17T11:35:49.000+0100}, title = {An efficient test-data compaction for low power VLSI testing.}, url = {http://dblp.uni-trier.de/db/conf/eit/eit2008.html#WuCLR08}, year = 2008 }