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An efficient test-data compaction for low power VLSI testing.

P. Wu, T. Chen, W. Li, and J. Rau. EIT, page 237-241. IEEE, (2008)

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Wei Lin

Wei Li

Li Wei

Other publications of authors with the same name

A Dual-Band Tunable Balanced Filter With Independently Tuning Bands.X. Fang, Y. Li, L. Li, W. Che, and Q. Xue. IEEE Trans. Circuits Syst. II Express Briefs, 69 (4): 2076-2080 (2022)Maximum-likelihood MIMO detection using adaptive hybrid tree search.K. Lai, J. Jia, and L. Lin. PIMRC, page 1506-1510. IEEE, (2011)Test slice difference technique for low power encoding.W. Li, T. Chen, P. Wu, and J. Rau. HLDVT, page 25-32. IEEE Computer Society, (2008)RAMP: reconfigurable architecture and mobility platform.J. Chen, J. Yeh, Y. Lan, L. Lin, F. Chen, and S. Hung. GLOBECOM, page 6. IEEE, (2005)New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology.T. Chen, W. Li, P. Wu, and J. Rau. Asian Test Symposium, page 105-110. IEEE Computer Society, (2009)A Novel Overlapping Fingerprint Partition and Reconstruction Based on Vector Flow Method.K. Hung, L. Chen, and W. Lin. IIAI-AAI, page 841-846. IEEE Computer Society, (2017)How to reduce the false alarm rate beyond voting system for financial distress prediction.J. Cheng, L. Lin, L. Lee, and J. Chang. FSKD, page 892-897. IEEE, (2015)Alloying modification of Sn-Ag-Cu solders by manganese and titanium.L. Lin, J. Song, Y. Lai, Y. Chiu, N. Lee, and J. Uan. Microelectron. Reliab., 49 (3): 235-241 (2009)Teaching High School Students Computational Thinking with Hands-on Activities.W. Li, C. Hu, and C. Wu. ITiCSE, page 371. ACM, (2016)A pHEMT power amplfier with an on-off modulator.H. Yang, L. Lin, and Y. Chen. RWS, page 79-81. IEEE, (2013)

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Disambiguation of "Li, Wei-Lin"

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An efficient test-data compaction for low power VLSI testing.

Please choose a person to relate this publication to

Wei Lin

Wei Lin

Wei Li

Wei Li

Li Wei

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Li, Wei-Lin"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML An efficient test-data compaction for low power VLSI testing.

Please choose a person to relate this publication to

Wei Lin

Wei Lin

Wei Li

Wei Li

Li Wei

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

An efficient test-data compaction for low power VLSI testing.