%0 Conference Paper %1 conf/aspdac/KangGPR08 %A Kang, Kunhyuk %A Gangwal, Saakshi %A Park, Sang Phill %A Roy, Kaushik %B ASP-DAC %D 2008 %E Kyung, Chong-Min %E Choi, Kiyoung %E Ha, Soonhoi %I IEEE %K dblp %P 726-731 %T NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2008.html#KangGPR08 %@ 978-1-4244-1922-7

@inproceedings{conf/aspdac/KangGPR08, added-at = {2017-05-26T00:00:00.000+0200}, author = {Kang, Kunhyuk and Gangwal, Saakshi and Park, Sang Phill and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2d72ab3364abdf7992d2c40b8a1918fc3/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2008}, editor = {Kyung, Chong-Min and Choi, Kiyoung and Ha, Soonhoi}, ee = {http://dl.acm.org/citation.cfm?id=1356976}, interhash = {90ea2c68cb7a94ea0c3c457d9f3918da}, intrahash = {d72ab3364abdf7992d2c40b8a1918fc3}, isbn = {978-1-4244-1922-7}, keywords = {dblp}, pages = {726-731}, publisher = {IEEE}, timestamp = {2019-10-17T16:44:23.000+0200}, title = {NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2008.html#KangGPR08}, year = 2008 }