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Disambiguation of "Kang, Kunhyuk"

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NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?

, , , and . ASP-DAC, page 726-731. IEEE, (2008)

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Mujin Kang

Ewha Kang

Mihyun Kang

Kang Teng

Andree Kang

 

Other publications of authors with the same name

Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations., , and . ICCAD, page 736-741. IEEE Computer Society, (2005)Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement., , , , and . DAC, page 358-363. IEEE, (2007)Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ., , and . ITC, page 1-10. IEEE Computer Society, (2007)Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop., , and . DAC, page 934-939. IEEE, (2007)Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance., , , and . ICCAD, page 730-734. IEEE Computer Society, (2007)Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI., , , and . ICCD, page 216-221. IEEE, (2006)Effectiveness of low power dual-Vt designs in nano-scale technologies under process parameter variations., , , , and . ISLPED, page 14-19. ACM, (2005)NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?, , , and . ASP-DAC, page 726-731. IEEE, (2008)Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling., , , , and . CICC, page 439-442. IEEE, (2005)Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring., , , and . ITC, page 10. IEEE Computer Society, (2005)