%0 Journal Article %1 journals/ieicetc/MorishitaSKII22 %A Morishita, Fukashi %A Saito, Wataru %A Kato, Norihito %A Iizuka, Yoichi %A Ito, Masao %D 2022 %J IEICE Trans. Electron. %K dblp %N 7 %P 316-323 %T High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor. %U http://dblp.uni-trier.de/db/journals/ieicetc/ieicetc105.html#MorishitaSKII22 %V 105-C

@article{journals/ieicetc/MorishitaSKII22, added-at = {2023-06-26T00:00:00.000+0200}, author = {Morishita, Fukashi and Saito, Wataru and Kato, Norihito and Iizuka, Yoichi and Ito, Masao}, biburl = {https://www.bibsonomy.org/bibtex/2e72c19a384f71c782928228531d59463/dblp}, ee = {https://doi.org/10.1587/transele.2021cdp0001}, interhash = {99c37b68b83f29883f94dd1b73808d5a}, intrahash = {e72c19a384f71c782928228531d59463}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 7, pages = {316-323}, timestamp = {2024-04-09T03:20:31.000+0200}, title = {High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor.}, url = {http://dblp.uni-trier.de/db/journals/ieicetc/ieicetc105.html#MorishitaSKII22}, volume = {105-C}, year = 2022 }