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High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor.

, , , , and . IEICE Trans. Electron., 105-C (7): 316-323 (2022)

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A 7b 1.4GS/s ADC with offset drift suppression techniques for one-time calibration., , , , , , , , and . CICC, page 1-4. IEEE, (2012)Circuit Techniques to Improve Low-Light Characteristics and High-Accuracy Evaluation System for CMOS Image Sensor., , , and . Sensors, 22 (16): 6040 (2022)A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems., , , , , , , , and . VLSI Circuits, page 1-2. IEEE, (2021)A 7-bit, 1.4 GS/s ADC With Offset Drift Suppression Techniques for One-Time Calibration., , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 60-I (8): 1979-1990 (2013)A Background Self-Calibrated 6b 2.7 GS/s ADC With Cascade-Calibrated Folding-Interpolating Architecture., , , , , and . IEEE J. Solid State Circuits, 45 (4): 707-718 (2010)High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor., , , , and . IEICE Trans. Electron., 105-C (7): 316-323 (2022)A 30.2-µ Vrms Horizontal Streak Noise 8.3-Mpixel 60-Frames/s CMOS Image Sensor With Skew-Relaxation ADC and On-Chip Testable Ramp Generator for Surveillance Camera., , , , , and . IEEE J. Solid State Circuits, 57 (10): 3103-3113 (2022)A Low Noise and Linearity Improvement CMOS Image Sensor for Surveillance Camera with Skew-Relaxation Local Multiply Circuit and On-Chip Testable Ramp Generator., , , , and . A-SSCC, page 1-3. IEEE, (2021)