%0 Conference Paper %1 conf/dac/YamadaWSITF77 %A Yamada, Akihiko %A Wakatsuki, Nobuo %A Shibano, Hideo %A Itoh, Osamu %A Tomita, Kyoji %A Funatsu, Shigehiro %B DAC %D 1977 %E Brinsfield, Judith G. %E Szygenda, Stephen A. %E Hightower, David W. %I ACM %K dblp %P 78-83 %T Automatic test generation for large digital circuits. %U http://dblp.uni-trier.de/db/conf/dac/dac1977.html#YamadaWSITF77

@inproceedings{conf/dac/YamadaWSITF77, added-at = {2012-03-01T00:00:00.000+0100}, author = {Yamada, Akihiko and Wakatsuki, Nobuo and Shibano, Hideo and Itoh, Osamu and Tomita, Kyoji and Funatsu, Shigehiro}, biburl = {https://www.bibsonomy.org/bibtex/2d2ba57e772949f7f5fca6a215f273ebd/dblp}, booktitle = {DAC}, crossref = {conf/dac/1977}, editor = {Brinsfield, Judith G. and Szygenda, Stephen A. and Hightower, David W.}, ee = {http://dl.acm.org/citation.cfm?id=809108}, interhash = {a206c84d8f119582444321ec1c71fab8}, intrahash = {d2ba57e772949f7f5fca6a215f273ebd}, keywords = {dblp}, pages = {78-83}, publisher = {ACM}, timestamp = {2012-03-02T11:34:27.000+0100}, title = {Automatic test generation for large digital circuits.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac1977.html#YamadaWSITF77}, year = 1977 }