%0 Journal Article %1 journals/mr/VoutilainenHM11 %A Voutilainen, Juha-Veikko %A Häkkinen, Juha %A Moilanen, Markku %D 2011 %J Microelectron. Reliab. %K dblp %N 2 %P 425-436 %T Solder interconnection failure time estimation based on the embedded precursor behaviour modelling. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#VoutilainenHM11 %V 51

@article{journals/mr/VoutilainenHM11, added-at = {2023-09-30T00:00:00.000+0200}, author = {Voutilainen, Juha-Veikko and Häkkinen, Juha and Moilanen, Markku}, biburl = {https://www.bibsonomy.org/bibtex/2990f4ae751457e687c168550f02c3887/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.08.007}, interhash = {a4a0d9935802caa1cbbd85863b9f9555}, intrahash = {990f4ae751457e687c168550f02c3887}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {425-436}, timestamp = {2024-04-09T02:48:37.000+0200}, title = {Solder interconnection failure time estimation based on the embedded precursor behaviour modelling.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#VoutilainenHM11}, volume = 51, year = 2011 }