%0 Journal Article %1 journals/mr/GorollPAG08 %A Goroll, Michael %A Pufall, Reinhard %A Aresu, Stefano %A Gustin, Wolfgang %D 2008 %J Microelectron. Reliab. %K dblp %N 8-9 %P 1509-1512 %T New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#GorollPAG08 %V 48

@article{journals/mr/GorollPAG08, added-at = {2020-02-22T00:00:00.000+0100}, author = {Goroll, Michael and Pufall, Reinhard and Aresu, Stefano and Gustin, Wolfgang}, biburl = {https://www.bibsonomy.org/bibtex/216d602ccbb23415fc7f611f624127602/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.07.010}, interhash = {a5dde2a8e2e2dfa50204bf4f39cf5323}, intrahash = {16d602ccbb23415fc7f611f624127602}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {8-9}, pages = {1509-1512}, timestamp = {2020-02-25T13:23:25.000+0100}, title = {New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#GorollPAG08}, volume = 48, year = 2008 }