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Disambiguation of "Gustin, Wolfgang"

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New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure.

, , , and . Microelectron. Reliab., 48 (8-9): 1509-1512 (2008)

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Wolfgang Gustin

Michael Gustin

Sylvia Gustin

Vilko Gustin i

Wolfgang Dahnert

 

Other publications of authors with the same name

New insights on the PBTI phenomena in SiON pMOSFETs., , , , , , and . Microelectron. Reliab., 52 (9-10): 1891-1894 (2012)NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification., , , , and . Microelectron. Reliab., (2018)New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure., , , and . Microelectron. Reliab., 48 (8-9): 1509-1512 (2008)Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs., , , , , and . IRPS, page 3. IEEE, (2022)Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors., , , , and . Microelectron. Reliab., 54 (9-10): 2310-2314 (2014)Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI., , , , and . ESSDERC, page 218-221. IEEE, (2018)Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits., , , , , and . Microelectron. Reliab., 45 (1): 39-46 (2005)Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs., , , , , , , , and . IRPS, page 1-10. IEEE, (2023)Understanding and modeling transient threshold voltage instabilities in SiC MOSFETs., , , , and . IRPS, page 3. IEEE, (2018)HCS degradation of 5 nm oxide high-voltage PLDMOS., , , , , and . Microelectron. Reliab., 54 (9-10): 1883-1886 (2014)