%0 Conference Paper %1 conf/isvlsi/KarelACGRS17 %A Karel, Amit %A Azaïs, Florence %A Comte, Mariane %A Gallière, Jean-Marc %A Renovell, Michel %A Singh, Keshav %B ISVLSI %D 2017 %I IEEE Computer Society %K dblp %P 320-325 %T Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. %U http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2017.html#KarelACGRS17 %@ 978-1-5090-6762-6

@inproceedings{conf/isvlsi/KarelACGRS17, added-at = {2024-04-19T00:00:00.000+0200}, author = {Karel, Amit and Azaïs, Florence and Comte, Mariane and Gallière, Jean-Marc and Renovell, Michel and Singh, Keshav}, biburl = {https://www.bibsonomy.org/bibtex/218e3273f72224864d3a83a2158865004/dblp}, booktitle = {ISVLSI}, crossref = {conf/isvlsi/2017}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2017.63}, interhash = {aa7248943b1ce11d1aef389dea721ab4}, intrahash = {18e3273f72224864d3a83a2158865004}, isbn = {978-1-5090-6762-6}, keywords = {dblp}, pages = {320-325}, publisher = {IEEE Computer Society}, timestamp = {2024-04-22T07:45:54.000+0200}, title = {Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.}, url = {http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2017.html#KarelACGRS17}, year = 2017 }