%0 Journal Article %1 journals/mr/RoldSMSBD01 %A Rold, M. Da %A Simoen, Eddy %A Mertens, Sofie %A Schaekers, Marc %A Badenes, G. %A Decoutere, Stefaan %D 2001 %J Microelectron. Reliab. %K dblp %N 12 %P 1933-1938 %T Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#RoldSMSBD01 %V 41

@article{journals/mr/RoldSMSBD01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Rold, M. Da and Simoen, Eddy and Mertens, Sofie and Schaekers, Marc and Badenes, G. and Decoutere, Stefaan}, biburl = {https://www.bibsonomy.org/bibtex/2de863dee80a4f04647265b8b3a1f798f/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00098-1}, interhash = {c054fc7f430dc35a1cec0a5420bd0a67}, intrahash = {de863dee80a4f04647265b8b3a1f798f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {1933-1938}, timestamp = {2020-02-25T13:25:23.000+0100}, title = {Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#RoldSMSBD01}, volume = 41, year = 2001 }