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Disambiguation of "Simoen, Eddy"

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Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS.

, , , , , and . Microelectron. Reliab., 41 (12): 1933-1938 (2001)

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Thek-Ling Eddy

Mau-Thek Eddy

Eddy Alger

Eddy Liando

Eddy Lanz

 

Other publications of authors with the same name

A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies., , , , , , , , , and 1 other author(s). IRPS, page 1-5. IEEE, (2021)Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs., , , , , , , and . IRPS, page 1-5. IEEE, (2021)Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs., , , , , , , , and . Microelectron. Reliab., 45 (9-11): 1376-1381 (2005)Impact of Device Architecture and Gate Stack Processing on the Low-Frequency Noise of Silicon Nanowire Transistors., , , , , , , and . ASICON, page 1-4. IEEE, (2019)Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs., , , , , , and . Microelectron. Reliab., 46 (9-11): 1657-1663 (2006)High-temperature performance of state-of-the-art triple-gate transistors., , , , , , and . Microelectron. Reliab., 47 (12): 2065-2069 (2007)Analytical modelling and device design optimisation of epitaxial layer-based III-V tunnel FET., , and . IET Circuits Devices Syst., 13 (6): 763-770 (2019)Study of the linear kink effect in PD SOI nMOSFETs., , , and . Microelectron. J., 38 (1): 114-119 (2007)Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs., , , , , , and . Microelectron. Reliab., 52 (9-10): 1924-1927 (2012)Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation., , , , , , , and . Microelectron. Reliab., 46 (9-11): 1731-1735 (2006)