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%0 Conference Paper
%1 conf/dft/AsamiHYA20
%A Asami, Ryuki
%A Hosokawa, Toshinori
%A Yoshimura, Masayoshi
%A Arai, Masayuki
%B DFT
%D 2020
%E Dilillo, Luigi
%E Psarakis, Mihalis
%E Siddiqua, Taniya
%I IEEE
%K dblp
%P 1-6
%T A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT.
%U http://dblp.uni-trier.de/db/conf/dft/dft2020.html#AsamiHYA20
%@ 978-1-7281-9457-8
@inproceedings{conf/dft/AsamiHYA20,
added-at = {2020-11-17T00:00:00.000+0100},
author = {Asami, Ryuki and Hosokawa, Toshinori and Yoshimura, Masayoshi and Arai, Masayuki},
biburl = {https://www.bibsonomy.org/bibtex/2c2ffbae6f60cf12085582cb4f0a8779e/dblp},
booktitle = {DFT},
crossref = {conf/dft/2020},
editor = {Dilillo, Luigi and Psarakis, Mihalis and Siddiqua, Taniya},
ee = {https://doi.org/10.1109/DFT50435.2020.9250810},
interhash = {cda3ba51f6bd6e83386c5d609272cdc7},
intrahash = {c2ffbae6f60cf12085582cb4f0a8779e},
isbn = {978-1-7281-9457-8},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2020-11-19T11:37:48.000+0100},
title = {A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT.},
url = {http://dblp.uni-trier.de/db/conf/dft/dft2020.html#AsamiHYA20},
year = 2020
}