Characterization of high pressure hydrogen annealing effect on polysilicon channel field effect transistors using isothermal deep level trap spectroscopy.
Bitte melden Sie sich an um selbst Rezensionen oder Kommentare zu erstellen.
Zitieren Sie diese Publikation
Mehr Zitationsstile
- bitte auswählen -
%0 Conference Paper
%1 conf/icicdt/NguyenNCHKCC16
%A Nguyen, Manh-Cuong
%A Nguyen, An Hoang-Thuy
%A Choi, Jae-Won
%A Han, Soo-Yeun
%A Kim, Jung-Yeon
%A Choi, Rino
%A Choi, Changhwan
%B ICICDT
%D 2016
%I IEEE
%K dblp
%P 1-4
%T Characterization of high pressure hydrogen annealing effect on polysilicon channel field effect transistors using isothermal deep level trap spectroscopy.
%U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2016.html#NguyenNCHKCC16
%@ 978-1-5090-0827-8
@inproceedings{conf/icicdt/NguyenNCHKCC16,
added-at = {2021-10-14T00:00:00.000+0200},
author = {Nguyen, Manh-Cuong and Nguyen, An Hoang-Thuy and Choi, Jae-Won and Han, Soo-Yeun and Kim, Jung-Yeon and Choi, Rino and Choi, Changhwan},
biburl = {https://www.bibsonomy.org/bibtex/2f38c8aebe775a0bb026a4ca9a8783db5/dblp},
booktitle = {ICICDT},
crossref = {conf/icicdt/2016},
ee = {https://doi.org/10.1109/ICICDT.2016.7542052},
interhash = {d0ecd3a618e545b7ae5950a1062f6d36},
intrahash = {f38c8aebe775a0bb026a4ca9a8783db5},
isbn = {978-1-5090-0827-8},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2024-04-10T21:06:02.000+0200},
title = {Characterization of high pressure hydrogen annealing effect on polysilicon channel field effect transistors using isothermal deep level trap spectroscopy.},
url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2016.html#NguyenNCHKCC16},
year = 2016
}
