%0 Conference Paper %1 conf/iscas/DubeyGB07 %A Dubey, Prashant %A Garg, Akhil %A Bhaskarani, Sravan Kumar %B ISCAS %D 2007 %I IEEE %K dblp %P 157-160 %T GALS Based Shared Test Architecture for Embedded Memories. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2007.html#DubeyGB07 %@ 1-4244-0921-7

@inproceedings{conf/iscas/DubeyGB07, added-at = {2016-05-20T00:00:00.000+0200}, author = {Dubey, Prashant and Garg, Akhil and Bhaskarani, Sravan Kumar}, biburl = {https://www.bibsonomy.org/bibtex/27940c0226bdad84c43370b0f56fbdad3/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2007}, ee = {http://dx.doi.org/10.1109/ISCAS.2007.378245}, interhash = {d1d89486e74f0b830fdbd535059ed533}, intrahash = {7940c0226bdad84c43370b0f56fbdad3}, isbn = {1-4244-0921-7}, keywords = {dblp}, pages = {157-160}, publisher = {IEEE}, timestamp = {2016-05-21T12:14:31.000+0200}, title = {GALS Based Shared Test Architecture for Embedded Memories.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2007.html#DubeyGB07}, year = 2007 }