Inproceedings,
Hazard driven test generation for SMT processors.
P. Singh, V. Narayanan, and D. Landis.DATE, page 256-259. IEEE, (2012)
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- BibTeX key
- conf/date/SinghNL12
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- inproceedings
- booktitle
- DATE
- year
- 2012
- pages
- 256-259
- publisher
- IEEE
- crossref
- conf/date/2012
- ee
- http://dl.acm.org/citation.cfm?id=2492772
- isbn
- 978-1-4577-2145-8
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- http://dblp.uni-trier.de/db/conf/date/date2012.html#SinghNL12
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- please select -%0 Conference Paper
%1 conf/date/SinghNL12
%A Singh, Padmaraj
%A Narayanan, Vijaykrishnan
%A Landis, David L.
%B DATE
%D 2012
%E Rosenstiel, Wolfgang
%E Thiele, Lothar
%I IEEE
%K dblp
%P 256-259
%T Hazard driven test generation for SMT processors.
%U http://dblp.uni-trier.de/db/conf/date/date2012.html#SinghNL12
%@ 978-1-4577-2145-8
@inproceedings{conf/date/SinghNL12,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Singh, Padmaraj and Narayanan, Vijaykrishnan and Landis, David L.},
biburl = {https://www.bibsonomy.org/bibtex/29acc5639ad77d4db1a377bc83eb8ddd9/dblp},
booktitle = {DATE},
crossref = {conf/date/2012},
editor = {Rosenstiel, Wolfgang and Thiele, Lothar},
ee = {http://dl.acm.org/citation.cfm?id=2492772},
interhash = {dd9cb75fb2cb70a2016a50cd854ccbaa},
intrahash = {9acc5639ad77d4db1a377bc83eb8ddd9},
isbn = {978-1-4577-2145-8},
keywords = {dblp},
pages = {256-259},
publisher = {IEEE},
timestamp = {2024-04-10T06:49:32.000+0200},
title = {Hazard driven test generation for SMT processors.},
url = {http://dblp.uni-trier.de/db/conf/date/date2012.html#SinghNL12},
year = 2012
}