%0 Journal Article %1 journals/mr/BusattoBCGIMPSS11 %A Busatto, Giovanni %A Bisello, D. %A Currò, Giuseppe %A Giubilato, Piero %A Iannuzzo, Francesco %A Mattiazzo, S. %A Pantano, D. %A Sanseverino, Annunziata %A Silvestrin, L. %A Tessaro, M. %A Velardi, Francesco %A Wyss, Jeffery %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1995-1998 %T A new test methodology for an exhaustive study of single-event-effects on power MOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#BusattoBCGIMPSS11 %V 51

@article{journals/mr/BusattoBCGIMPSS11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Busatto, Giovanni and Bisello, D. and Currò, Giuseppe and Giubilato, Piero and Iannuzzo, Francesco and Mattiazzo, S. and Pantano, D. and Sanseverino, Annunziata and Silvestrin, L. and Tessaro, M. and Velardi, Francesco and Wyss, Jeffery}, biburl = {https://www.bibsonomy.org/bibtex/2d7573675cffdeb05bb45f81caba8ec20/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.07.023}, interhash = {de14f8b629b69925cbeabe548139bb32}, intrahash = {d7573675cffdeb05bb45f81caba8ec20}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1995-1998}, timestamp = {2020-02-25T13:29:55.000+0100}, title = {A new test methodology for an exhaustive study of single-event-effects on power MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#BusattoBCGIMPSS11}, volume = 51, year = 2011 }