Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors.
M. Hemmat, M. Kamal, A. Afzali-Kusha, and M. Pedram. VLSI-SoC (Selected Papers), volume 508 of IFIP Advances in Information and Communication Technology, page 41-59. Springer, (2016)
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%0 Conference Paper
%1 conf/vlsi/HemmatKAP16a
%A Hemmat, Maedeh
%A Kamal, Mehdi
%A Afzali-Kusha, Ali
%A Pedram, Massoud
%B VLSI-SoC (Selected Papers)
%D 2016
%E Hollstein, Thomas
%E Raik, Jaan
%E Kostin, Sergei
%E Tsertov, Anton
%E O'Connor, Ian
%E Reis, Ricardo
%I Springer
%K dblp
%P 41-59
%T Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors.
%U http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2016s.html#HemmatKAP16a
%V 508
%@ 978-3-319-67104-8
@inproceedings{conf/vlsi/HemmatKAP16a,
added-at = {2017-09-05T00:00:00.000+0200},
author = {Hemmat, Maedeh and Kamal, Mehdi and Afzali-Kusha, Ali and Pedram, Massoud},
biburl = {https://www.bibsonomy.org/bibtex/2e4927e79303a34d0ac059acb2db14422/dblp},
booktitle = {VLSI-SoC (Selected Papers)},
crossref = {conf/vlsi/2016socs},
editor = {Hollstein, Thomas and Raik, Jaan and Kostin, Sergei and Tsertov, Anton and O'Connor, Ian and Reis, Ricardo},
ee = {https://doi.org/10.1007/978-3-319-67104-8_3},
interhash = {e76717154aea6d6621ae66898c95701c},
intrahash = {e4927e79303a34d0ac059acb2db14422},
isbn = {978-3-319-67104-8},
keywords = {dblp},
pages = {41-59},
publisher = {Springer},
series = {IFIP Advances in Information and Communication Technology},
timestamp = {2019-10-23T11:39:59.000+0200},
title = {Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors.},
url = {http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2016s.html#HemmatKAP16a},
volume = 508,
year = 2016
}
