Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors.
M. Hemmat, M. Kamal, A. Afzali-Kusha, and M. Pedram. VLSI-SoC (Selected Papers), volume 508 of IFIP Advances in Information and Communication Technology, page 41-59. Springer, (2016)
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