%0 Journal Article %1 journals/ieicet/LeeYCS07 %A Lee, Hochul %A Yoon, Youngchang %A Cho, Seongjae %A Shin, Hyungcheol %D 2007 %J IEICE Trans. Electron. %K dblp %N 5 %P 968-972 %T Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet90c.html#LeeYCS07 %V 90-C

@article{journals/ieicet/LeeYCS07, added-at = {2020-04-11T00:00:00.000+0200}, author = {Lee, Hochul and Yoon, Youngchang and Cho, Seongjae and Shin, Hyungcheol}, biburl = {https://www.bibsonomy.org/bibtex/2194bc2a9339682b3a5f81bf4c29b0881/dblp}, ee = {https://doi.org/10.1093/ietele/e90-c.5.968}, interhash = {e96675d97153f7bcfddd9a46899a15ba}, intrahash = {194bc2a9339682b3a5f81bf4c29b0881}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 5, pages = {968-972}, timestamp = {2020-04-14T11:55:20.000+0200}, title = {Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet90c.html#LeeYCS07}, volume = {90-C}, year = 2007 }