%0 Journal Article %1 journals/mr/HadiSWTIK16 %A Hadi, M. S. %A Sugii, Nobuyuki %A Wakabayashi, Hitoshi %A Tsutsui, Kazuo %A Iwai, Hiroshi %A Kakushima, Kuniyuki %D 2016 %J Microelectron. Reliab. %K dblp %P 42-45 %T Resistive switching properties of a thin SiO2 layer with CeOx buffer layer on n+ and p+ Si bottom electrodes. %U http://dblp.uni-trier.de/db/journals/mr/mr63.html#HadiSWTIK16 %V 63

@article{journals/mr/HadiSWTIK16, added-at = {2021-10-14T00:00:00.000+0200}, author = {Hadi, M. S. and Sugii, Nobuyuki and Wakabayashi, Hitoshi and Tsutsui, Kazuo and Iwai, Hiroshi and Kakushima, Kuniyuki}, biburl = {https://www.bibsonomy.org/bibtex/27436c33da6f213806219a250ed4e9fb9/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.06.013}, interhash = {f47658a822fc0b0e7cce6b1017b6aec4}, intrahash = {7436c33da6f213806219a250ed4e9fb9}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {42-45}, timestamp = {2024-04-09T02:50:13.000+0200}, title = {Resistive switching properties of a thin SiO2 layer with CeOx buffer layer on n+ and p+ Si bottom electrodes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr63.html#HadiSWTIK16}, volume = 63, year = 2016 }