%0 Conference Paper %1 conf/itc/MalyGZVBS03 %A Maly, Wojciech %A Gattiker, Anne E. %A Zanon, Thomas %A Vogels, Thomas J. %A Blanton, R. D. (Shawn) %A Storey, Thomas M. %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 856-865 %T Deformations of IC Structure in Test and Yield Learning. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#MalyGZVBS03 %@ 0-7803-8106-8

@inproceedings{conf/itc/MalyGZVBS03, added-at = {2023-03-23T00:00:00.000+0100}, author = {Maly, Wojciech and Gattiker, Anne E. and Zanon, Thomas and Vogels, Thomas J. and Blanton, R. D. (Shawn) and Storey, Thomas M.}, biburl = {https://www.bibsonomy.org/bibtex/28ebbe255256464e088655b1064a8b7ff/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271071}, interhash = {fe3952a4681f0394ad49ba5166c1afc9}, intrahash = {8ebbe255256464e088655b1064a8b7ff}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {856-865}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {Deformations of IC Structure in Test and Yield Learning.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#MalyGZVBS03}, year = 2003 }