Inproceedings,
High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.
S. Shin, Y. Chen, W. Ahn, H. Guo, B. Williams, J. West, T. Bonifield, D. Varghese, S. Krishnan, and M. Alam.IRPS, page 9-1. IEEE, (2018)
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- conf/irps/ShinCAGWWBVKA18
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2018
- pages
- 9-1
- publisher
- IEEE
- crossref
- conf/irps/2018
- ee
- https://doi.org/10.1109/IRPS.2018.8353669
- isbn
- 978-1-5386-5479-8
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ShinCAGWWBVKA18
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- please select -%0 Conference Paper
%1 conf/irps/ShinCAGWWBVKA18
%A Shin, SangHoon
%A Chen, Yen-Pu
%A Ahn, Woojin
%A Guo, Honglin
%A Williams, Byron
%A West, Jeff
%A Bonifield, Tom
%A Varghese, Dhanoop
%A Krishnan, Srikanth
%A Alam, Muhammad Ashraful
%B IRPS
%D 2018
%I IEEE
%K dblp
%P 9-1
%T High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.
%U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ShinCAGWWBVKA18
%@ 978-1-5386-5479-8
@inproceedings{conf/irps/ShinCAGWWBVKA18,
added-at = {2019-05-31T00:00:00.000+0200},
author = {Shin, SangHoon and Chen, Yen-Pu and Ahn, Woojin and Guo, Honglin and Williams, Byron and West, Jeff and Bonifield, Tom and Varghese, Dhanoop and Krishnan, Srikanth and Alam, Muhammad Ashraful},
biburl = {https://www.bibsonomy.org/bibtex/2498fa974b1bc7ea09abeb015ad6ecb79/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2018},
ee = {https://doi.org/10.1109/IRPS.2018.8353669},
interhash = {fed9ce02defa4cffc655b93153e68f0c},
intrahash = {498fa974b1bc7ea09abeb015ad6ecb79},
isbn = {978-1-5386-5479-8},
keywords = {dblp},
pages = {9-1},
publisher = {IEEE},
timestamp = {2019-10-17T14:45:36.000+0200},
title = {High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ShinCAGWWBVKA18},
year = 2018
}